CD4060是一種內部功能完善的集成塊，應用比較靈活。本文介紹一種巧妙利CD4060的一些特點設計出的快速充電器。
    大 家知(zhi)道，鎳鎳電(dian)(dian)(dian)(dian)(dian)池充足電(dian)(dian)(dian)(dian)(dian)后，電(dian)(dian)(dian)(dian)(dian)池兩(liang)端電(dian)(dian)(dian)(dian)(dian)壓不僅(jin)不再上升，還會出現下降(jiang)趨勢。如果在充電(dian)(dian)(dian)(dian)(dian)過程中測出其(qi)下降(jiang)趨勢，便可(ke)保證電(dian)(dian)(dian)(dian)(dian)池所(suo)需(xu)的準確充電(dian)(dian)(dian)(dian)(dian)時間，實現大電(dian)(dian)(dian)(dian)(dian)流(liu) 快(kuai)速充電(dian)(dian)(dian)(dian)(dian)，延長電(dian)(dian)(dian)(dian)(dian)池壽命。但(dan)多(duo)(duo)數(shu)電(dian)(dian)(dian)(dian)(dian)路(lu)較復雜，不易(yi)(yi)制作。平時所(suo)見充電(dian)(dian)(dian)(dian)(dian)器(qi)電(dian)(dian)(dian)(dian)(dian)路(lu)多(duo)(duo)用電(dian)(dian)(dian)(dian)(dian)壓比較法，不易(yi)(yi)調(diao)準，常產生誤差。本電(dian)(dian)(dian)(dian)(dian)路(lu)適用于(yu)所(suo)提要求，且可(ke)提供不同的 充電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流(liu)以適應不同的需(xu)要，電(dian)(dian)(dian)(dian)(dian)路(lu)簡單，制作容(rong)易(yi)(yi)。

    電路如圖所示。ICl中的壓控振蕩器(VCO)受加在9腳上的電池電壓的控制， 其輸出信號一路送入IC2中的相位比較器14腳，與IC2中的VCO信號進行相位比較，比較結果控制IC2中的壓控振蕩器；另一路送入ICl中的相位比較器，與IC2來的VCO信號進行比較，其結果控制充電電路。充電時，電池電壓上升，使ICl中的VCO振蕩頻率上升。當13腳為低電平時，C6放電極其緩 慢。
電(dian)(dian)(dian)(dian)路中(zhong)，VD3為(wei)(wei)IC提供(gong)恒(heng)(heng)定電(dian)(dian)(dian)(dian)壓(ya)，可防止(zhi)干(gan)擾(rao)(rao)。VDl、V4組成恒(heng)(heng)流電(dian)(dian)(dian)(dian)路，可防止(zhi)誤動(dong)(dong)作(zuo)(zuo)且轉動(dong)(dong)開關(guan)(guan)S2,可獲(huo)得(de)不同的充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流，按圖 6?15所(suo)示，可分(fen)別獲(huo)得(de)約50mA(R9擋)、300mA(R8擋)、1A(R10擋)的充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流。電(dian)(dian)(dian)(dian)容Cl、電(dian)(dian)(dian)(dian)阻(zu)Rl為(wei)(wei)延時電(dian)(dian)(dian)(dian)路，它主要用以防止(zhi)干(gan)擾(rao)(rao) 引起誤動(dong)(dong)作(zuo)(zuo)及可長(chang)時間不取出電(dian)(dian)(dian)(dian)池。若C6放電(dian)(dian)(dian)(dian)過多，電(dian)(dian)(dian)(dian)路便重新(xin)啟動(dong)(dong)充電(dian)(dian)(dian)(dian)。S1為(wei)(wei)電(dian)(dian)(dian)(dian)源開關(guan)(guan)兼(jian)啟動(dong)(dong)開關(guan)(guan)。S3為(wei)(wei)微動(dong)(dong)開關(guan)(guan)，可消除C6上(shang)電(dian)(dian)(dian)(dian)壓(ya)對下次充電(dian)(dian)(dian)(dian)的影響。