鋰離子(Li+)電池比其它化學類型的電池更脆弱，對于違規操作具有非常小的容限。因此，鋰電池充電(dian)(dian)電(dian)(dian)路比較復雜(za)，要求高精(jing)度電(dian)(dian)流、電(dian)(dian)壓(ya)設置。如果無法滿足這些(xie)精(jing)度要求，充電(dian)(dian)器可(ke)能(neng)無法將(jiang)電(dian)(dian)池(chi)完(wan)全充滿，進(jin)而降(jiang)低電(dian)(dian)池(chi)壽命，或影響電(dian)(dian)池(chi)性(xing)能(neng)。

　　鑒于對Li+電池充電器的這些要求，對(dui)(dui)充(chong)電器設計進行完(wan)全測試并在(zai)整個工(gong)作范圍(wei)內(nei)進行分段測試非(fei)常(chang)重要。然而(er)，采用常(chang)規負載(即Li+電池)測試Li+電池充(chong)電器將(jiang)非(fei)常(chang)耗時，而(er)且在(zai)實驗室和生產環境中也難于實現(xian)。為了簡化測試過程，本文給(gei)出了一個電池仿真電路，可加快測試速度，在(zai)不帶實際電池的情(qing)況下實現(xian)對(dui)(dui)鋰離子電池充(chong)電器的測試。

　　CC-CV充電

　　鋰離子電池(chi)充(chong)電過程的第一(yi)階段需要中等精度(du)的恒(heng)流(liu)(CC)充(chong)電，然后在第二階段過渡到高(gao)精度(du)恒(heng)壓(ya)(CV)充(chong)電。

　　圖(tu)(tu)1為(wei)用于鋰(li)離子(zi)電(dian)池充電(dian)器的(de)CC-CV集成電(dian)路(lu)(MAX1737)的(de)V-I特(te)性(xing)曲線。這種類型的(de)IC是消費類產品中(zhong)所有鋰(li)離子(zi)電(dian)池充電(dian)器的(de)核心。圖(tu)(tu)中(zhong)可清楚

　　看(kan)出CC (2.6V至4.2V電(dian)池電(dian)壓)和CV (4.2V)區域。

　　圖1. MAX1737的V-I曲線是Li+電池充電器的標準特性曲線

　　電池低于2.6V時，需要采用不同的充電技術。如果試圖對放電至2.6V以下的電池充電，充電器須(xu)(xu)提供一(yi)個較低的充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(“調理電(dian)(dian)(dian)(dian)流”)，將電(dian)(dian)(dian)(dian)池電(dian)(dian)(dian)(dian)壓充(chong)至2.6V。這是(shi)鋰離(li)子電(dian)(dian)(dian)(dian)池過放電(dian)(dian)(dian)(dian)時(shi)所必須(xu)(xu)采取的安全機制。VBATT< 2.6V時(shi)強行進(jin)行快速充(chong)電(dian)(dian)(dian)(dian)，會使電(dian)(dian)(dian)(dian)池進(jin)入不可恢(hui)復的短路狀態。

　　CC向CV階段的(de)(de)過渡點的(de)(de)臨界容差為± 40mV。之(zhi)所以要求如(ru)此嚴格(ge)的(de)(de)容差，是(shi)因為如(ru)果CV過低(di)，電(dian)(dian)池(chi)將(jiang)無法(fa)完全充(chong)滿(man);而CV過高，則會縮短(duan)電(dian)(dian)池(chi)的(de)(de)使用壽命(ming)。充(chong)電(dian)(dian)過程(cheng)終止(zhi)意味(wei)著檢測到電(dian)(dian)池(chi)達到滿(man)電(dian)(dian)量，充(chong)電(dian)(dian)器必須斷開或(huo)關閉。在CV階段，當檢測到充(chong)電(dian)(dian)電(dian)(dian)流降至快充(chong)電(dian)(dian)流或(huo)最大充(chong)電(dian)(dian)電(dian)(dian)流的(de)(de)一(yi)定比例(通(tong)常< 10%)時(shi)終止(zhi)充(chong)電(dian)(dian)。

　　Li+電池充電器參(can)數測(ce)試

　　Li+電(dian)(dian)池充電(dian)(dian)器設計(ji)通常包括兩個(ge)基本部分(fen)(fen)：數(shu)字部分(fen)(fen)(控制狀態(tai)機(ji))和模擬部分(fen)(fen)，模擬部分(fen)(fen)包括帶有(you)高精(jing)(jing)度(du)(>1%)基準(zhun)、可精(jing)(jing)確控制的(de)電(dian)(dian)流(liu)/電(dian)(dian)壓源。對鋰離子充電(dian)(dian)器(不僅(jin)指IC)進行(xing)完全測(ce)試(shi)是一項非常棘(ji)手且耗費時間的(de)工作，不僅(jin)僅(jin)限于對電(dian)(dian)流(liu)或(huo)電(dian)(dian)壓值進行(xing)檢驗(yan)。

　　測(ce)(ce)(ce)試時(shi)，應(ying)該(gai)在整個工作范圍對充(chong)電(dian)(dian)(dian)器(qi)進行分(fen)段(duan)檢(jian)測(ce)(ce)(ce)：包括(kuo)CC階段(duan)、從(cong)CC到CV的切換、充(chong)電(dian)(dian)(dian)終止等。如(ru)上(shang)所述，測(ce)(ce)(ce)試的理想情況是采(cai)用常規充(chong)電(dian)(dian)(dian)器(qi)的負載：即Li+電(dian)(dian)(dian)池(chi)。然而，由于(yu)充(chong)電(dian)(dian)(dian)過程需(xu)要一小(xiao)時(shi)甚至更長(chang)時(shi)間，使(shi)用鋰電(dian)(dian)(dian)池(chi)進行測(ce)(ce)(ce)試非常耗時(shi)。根據具體測(ce)(ce)(ce)試條(tiao)件的不同(tong)：例如(ru)大容量電(dian)(dian)(dian)池(chi)+慢速(su)充(chong)電(dian)(dian)(dian)，小(xiao)容量電(dian)(dian)(dian)池(chi)+快(kuai)速(su)充(chong)電(dian)(dian)(dian)以及其它可(ke)能組合，測(ce)(ce)(ce)試時(shi)間也不盡相同(tong)。

　　此外，充電(dian)(dian)(dian)(dian)過(guo)程(cheng)無法在保(bao)證不(bu)損壞電(dian)(dian)(dian)(dian)池(chi)的(de)(de)前提下提高(gao)充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)，因(yin)為充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)受電(dian)(dian)(dian)(dian)池(chi)最大充電(dian)(dian)(dian)(dian)速率(即快速充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu))的(de)(de)制(zhi)約。對于(yu)消(xiao)費類產品常用的(de)(de)電(dian)(dian)(dian)(dian)池(chi)，很少規定(ding)電(dian)(dian)(dian)(dian)流(liu)大于(yu)1C (在1小時(shi)(shi)內將電(dian)(dian)(dian)(dian)池(chi)完(wan)全放電(dian)(dian)(dian)(dian)的(de)(de)電(dian)(dian)(dian)(dian)流(liu))。因(yin)此，大多數情(qing)況下完(wan)成整個充電(dian)(dian)(dian)(dian)周期所(suo)需(xu)要的(de)(de)時(shi)(shi)間往往超過(guo)兩小時(shi)(shi)。如果需(xu)要重復測(ce)試(shi)，則需(xu)要將電(dian)(dian)(dian)(dian)池(chi)完(wan)全放電(dian)(dian)(dian)(dian) ― 這一過(guo)程(cheng)僅僅比充電(dian)(dian)(dian)(dian)稍微短一些。或者(zhe)，必須能夠隨時(shi)(shi)備有完(wan)全放電(dian)(dian)(dian)(dian)的(de)(de)電(dian)(dian)(dian)(dian)池(chi)。

　　另外(wai)可以使(shi)用(yong)一個模(mo)擬(ni)的(de)(de)理(li)想負載替(ti)代真實電(dian)(dian)池進(jin)行(xing)負載測試(shi)(shi)。仿真時(shi)，應(ying)驗證電(dian)(dian)路的(de)(de)直流(liu)響應(ying)和動態穩定性。然而(er)，使(shi)用(yong)功率測試(shi)(shi)所用(yong)的(de)(de)標準負載進(jin)行(xing)電(dian)(dian)池仿真非常(chang)困難。與大多數電(dian)(dian)源測試(shi)(shi)使(shi)用(yong)的(de)(de)負載不同(tong)，電(dian)(dian)池不能簡單地(di)當作電(dian)(dian)阻或固定地(di)吸入電(dian)(dian)流(liu)。如上所述，必須在(zai)整個工作范圍內進(jin)行(xing)分段測試(shi)(shi)。以下介紹的(de)(de)Li+充電(dian)(dian)器(qi)測試(shi)(shi)電(dian)(dian)路完全滿足(zu)這(zhe)些要求。

　　選擇電池模型負載

　　我們先討論兩個必須考慮但最終放棄的建模方法。電池負載建模的方法之一是：使用一個具有源出(放電)和吸入(充電)電流能力的電壓源與代表電池內阻的電阻串聯。由于Li+電池要求精確控制終止電壓和充電電流，目前所有Li+充電器實際上是穩(wen)壓(ya)電源轉換器。

　　此外，由于穩壓電源變換器(充電器)的穩定性取決于負載(電池)的動態特性，因此必須選擇一個與模型非常相似的負載。否則，測試只能驗證充電器本身的V-I特性。

　　如果只(zhi)是進行一(yi)次性測試(shi)，可(ke)以使(shi)用(yong)(yong)并(bing)(bing)聯(lian)(lian)型(xing)穩壓(ya)(ya)(ya)器與電(dian)(dian)阻串聯(lian)(lian)，這足以模擬(ni)電(dian)(dian)池(chi)的(de)(de)內阻，并(bing)(bing)且，這一(yi)簡單的(de)(de)電(dian)(dian)池(chi)模型(xing)完全(quan)可(ke)以滿(man)足測試(shi)要求。這種方(fang)法的(de)(de)優(you)勢是由充電(dian)(dian)器本身供電(dian)(dian)。然(ran)而，更嚴格的(de)(de)測試(shi)需要更精確的(de)(de)模型(xing)。該模型(xing)采用(yong)(yong)內部電(dian)(dian)壓(ya)(ya)(ya)源，電(dian)(dian)壓(ya)(ya)(ya)值是充電(dian)(dian)過(guo)程中供給電(dian)(dian)池(chi)的(de)(de)總電(dian)(dian)荷的(de)(de)函數(shu)。

　　用(yong)恒流源對電(dian)池(chi)(chi)充電(dian)時(shi)電(dian)壓將不斷(duan)變(bian)化(hua)，以(yi)一定的正斜(xie)率上(shang)升。這是(shi)由(you)于(yu)放電(dian)和其(qi)它電(dian)池(chi)(chi)內部(bu)化(hua)學變(bian)化(hua)過程中(zhong)，電(dian)池(chi)(chi)正極周(zhou)圍累(lei)積的極化(hua)離子逐漸減少。因此，充電(dian)器的工(gong)作點取決于(yu)電(dian)池(chi)(chi)連接時(shi)間的長短，以(yi)及(ji)電(dian)池(chi)(chi)的工(gong)作歷史。用(yong)大多數電(dian)子實(shi)驗室能夠找到(dao)的通用(yong)器件構建(jian)負載，以(yi)模(mo)擬這一復雜負載的模(mo)型很(hen)困難。

　　需(xu)要(yao)(yao)經常對(dui)充(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)路(lu)(lu)進行測試(shi)，或必須(xu)詳細(xi)描述(shu)電(dian)(dian)(dian)路(lu)(lu)特性時(shi)(shi)，準確(que)模(mo)擬(ni)充(chong)電(dian)(dian)(dian)過(guo)程的(de)(de)(de)(de)電(dian)(dian)(dian)池非常有(you)用。模(mo)擬(ni)過(guo)程需(xu)要(yao)(yao)連續掃描充(chong)電(dian)(dian)(dian)器的(de)(de)(de)(de)所有(you)直流(liu)工(gong)作點。模(mo)擬(ni)電(dian)(dian)(dian)路(lu)(lu)還要(yao)(yao)顯示結果(guo)(guo)，使操(cao)作人員可以(yi)查找問題、故障和干擾。如果(guo)(guo)模(mo)擬(ni)電(dian)(dian)(dian)路(lu)(lu)能(neng)夠(gou)提供電(dian)(dian)(dian)池電(dian)(dian)(dian)壓輸出和信號，這(zhe)些(xie)結果(guo)(guo)可以(yi)直接作為示波器信號。測試(shi)速度可以(yi)加(jia)(jia)快(從(cong)幾(ji)小(xiao)時(shi)(shi)到數十秒)，并可根據需(xu)要(yao)(yao)進行多次反復，比用真(zhen)正的(de)(de)(de)(de)電(dian)(dian)(dian)池測試(shi)更方(fang)便。然(ran)而，測試(shi)速度加(jia)(jia)快后對(dui)確(que)定(ding)充(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)源(yuan)的(de)(de)(de)(de)熱(re)效(xiao)應不利。因此，可能(neng)需(xu)要(yao)(yao)額外的(de)(de)(de)(de)長時(shi)(shi)間測試(shi)，以(yi)便與充(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)源(yuan)和調節(jie)電(dian)(dian)(dian)路(lu)(lu)的(de)(de)(de)(de)熱(re)時(shi)(shi)間常數相吻合。

　　 建立(li)電池模型負載(zai)

　　圖2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)模擬的(de)是單節(jie)鋰(li)離子(zi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)。充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)(qi)CC階段的(de)終(zhong)止充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓和(he)快速充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)由充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)(qi)設(she)置決定。仿(fang)(fang)真器(qi)(qi)(qi)(qi)初始(shi)(shi)化(hua)時，可(ke)設(she)置完全(quan)(quan)放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)條(tiao)件(jian)下內部(bu)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓為3V，但該電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓可(ke)以提升到(dao)4.3V，以測試過充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)情況。3V初始(shi)(shi)值通常用(yong)于低電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓關(guan)斷電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(用(yong)來終(zhong)止鋰(li)離子(zi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)過程)。這種設(she)計專門針對(dui)終(zhong)止充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓為4.2V的(de)標準(zhun)CC-CV鋰(li)離子(zi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)(qi)。該設(she)計調整起來很容易，能夠適(shi)應非標準(zhun)終(zhong)止電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓和(he)完全(quan)(quan)放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓的(de)測試。測試時充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)(qi)用(yong)高達(da)3A的(de)充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)驅動(dong)仿(fang)(fang)真電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)，受功(gong)率晶體管功(gong)耗的(de)限制。圖2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)模擬了電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓增加的(de)情況，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓是從(cong)仿(fang)(fang)真電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)設(she)置為完全(quan)(quan)放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)狀態(tai)開始(shi)(shi)，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)的(de)函(han)數。

　　根據圖中(zhong)給(gei)出的(de)參數值，充電(dian)(dian)(dian)電(dian)(dian)(dian)流(liu)為1A時(shi)，積分(fen)時(shi)間常數使模(mo)擬電(dian)(dian)(dian)路在(zai)6至7秒內達(da)到充電(dian)(dian)(dian)器的(de)4.2V限制。對電(dian)(dian)(dian)流(liu)范圍、內阻、充電(dian)(dian)(dian)終止電(dian)(dian)(dian)壓和完(wan)全放電(dian)(dian)(dian)電(dian)(dian)(dian)壓的(de)模(mo)擬是在(zai)鋰離子電(dian)(dian)(dian)池(本例中(zhong)指Sony US18650G3)典(dian)型參數的(de)基礎上完(wan)成(cheng)的(de)。所仿真的(de)電(dian)(dian)(dian)池電(dian)(dian)(dian)壓沒有(you)考慮環境溫度的(de)影響。

　　圖2 單(dan)節Li+電(dian)(dian)池充電(dian)(dian)情況(kuang)的仿(fang)真電(dian)(dian)路，該電(dian)(dian)路可以在不使(shi)用(yong)實際電(dian)(dian)池的情況(kuang)下測試Li+電(dian)(dian)池充電(dian)(dian)器

　　并聯穩壓器(qi)設計采用MAX8515并聯穩壓器(qi)和一(yi)對雙極(ji)型功率(lv)晶體(ti)管(選擇該穩壓器(qi)時考(kao)慮了其內部基(ji)準電壓的(de)精度)，大電流TIP35晶體(ti)管安(an)裝(zhuang)在(zai)能(neng)夠耗散25W熱量的(de)散熱器(qi)上。

　　MAX4163雙運放(fang)的(de)其中一個放(fang)大(da)器用來對(dui)(dui)充電(dian)(dian)電(dian)(dian)流(liu)積分，另(ling)一個放(fang)大(da)器對(dui)(dui)電(dian)(dian)流(liu)測量信(xin)號進行放(fang)大(da)和偏(pian)置。該運算放(fang)大(da)器具有較(jiao)高的(de)電(dian)(dian)源抑制比，并可支(zhi)持滿(man)擺幅輸(shu)入(ru)/輸(shu)出(chu)范圍，簡(jian)化了兩(liang)種功能(neng)電(dian)(dian)路的(de)設(she)計。注意，與電(dian)(dian)池仿真器正端串聯的(de)0.100Ω電(dian)(dian)流(liu)檢測電(dian)(dian)阻同時也作(zuo)為電(dian)(dian)池內阻。

　　在具有(you)自動測(ce)試-數(shu)據(ju)采集功能的系統內(nei)工作時，可(ke)用外部信號將(jiang)仿真電池(chi)復(fu)位到完全放電狀態。另外，手動操作測(ce)試設(she)置時，可(ke)用按鍵復(fu)位。

　　利用單刀單擲開(kai)關可(ke)以選擇仿真(zhen)電(dian)(dian)(dian)池(chi)的(de)(de)兩(liang)種工作模式。擲向(xiang)A端時(shi)，實現積分充電(dian)(dian)(dian)仿真(zhen)器(qi)，如上(shang)所述。擲向(xiang)B端時(shi)，仿真(zhen)器(qi)將設(she)定在某一固定的(de)(de)直流工作點對充電(dian)(dian)(dian)器(qi)進(jin)行現場測試時(shi)的(de)(de)輸出(chu)電(dian)(dian)(dian)壓(ya)(ya)和(he)吸電(dian)(dian)(dian)流。為實現這(zhe)一功能，“設(she)置”電(dian)(dian)(dian)壓(ya)(ya)可(ke)通過(guo)改變50kΩ可(ke)變電(dian)(dian)(dian)阻，在2.75V至5.75V之(zhi)間手動調(diao)整。這(zhe)些設(she)置電(dian)(dian)(dian)壓(ya)(ya)值(zhi)與內部吸入(ru)電(dian)(dian)(dian)流有(you)關。仿真(zhen)器(qi)端實測電(dian)(dian)(dian)壓(ya)(ya)(VBATT)等于設(she)定電(dian)(dian)(dian)壓(ya)(ya)加上(shang)吸電(dian)(dian)(dian)流流經仿真(zhen)電(dian)(dian)(dian)池(chi)內阻(0.100Ω電(dian)(dian)(dian)阻)產(chan)生的(de)(de)壓(ya)(ya)降。仿真(zhen)電(dian)(dian)(dian)路工作時(shi)的(de)(de)電(dian)(dian)(dian)源(yuan)取(qu)自電(dian)(dian)(dian)池(chi)充電(dian)(dian)(dian)器(qi)輸出(chu)。

　　仿真電路的性能

　　圖(tu)3為模擬鋰離子電(dian)(dian)(dian)(dian)池充(chong)(chong)電(dian)(dian)(dian)(dian)至(zhi)4.2V時(shi)獲(huo)得的(de)(de)典型V-I波形(xing)。從(cong)圖(tu)中可(ke)以(yi)看出兩個測試(shi)過程：一(yi)個是(shi)以(yi)1A初始快充(chong)(chong)電(dian)(dian)(dian)(dian)流充(chong)(chong)電(dian)(dian)(dian)(dian)(曲線(xian)B和D)，另一(yi)個是(shi)以(yi)2A快充(chong)(chong)電(dian)(dian)(dian)(dian)流充(chong)(chong)電(dian)(dian)(dian)(dian)(曲線(xian)A和C)。這兩種情況下，首先進入(ru)CC階段充(chong)(chong)電(dian)(dian)(dian)(dian)，直(zhi)到(dao)電(dian)(dian)(dian)(dian)池電(dian)(dian)(dian)(dian)壓(ya)(ya)達(da)(da)到(dao)終止(zhi)電(dian)(dian)(dian)(dian)壓(ya)(ya)4.2V。在此之后，電(dian)(dian)(dian)(dian)流呈指數(shu)衰減，而(er)仿真電(dian)(dian)(dian)(dian)池的(de)(de)電(dian)(dian)(dian)(dian)壓(ya)(ya)保(bao)持(chi)不變。充(chong)(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流為2A時(shi)到(dao)達(da)(da)終止(zhi)電(dian)(dian)(dian)(dian)壓(ya)(ya)所(suo)需的(de)(de)時(shi)間更短，與預期設計相同。然(ran)而(er)，請注意，電(dian)(dian)(dian)(dian)流加倍不會使充(chong)(chong)電(dian)(dian)(dian)(dian)時(shi)間減半，只(zhi)會使到(dao)達(da)(da)CV模式(shi)的(de)(de)時(shi)間減半，與真實電(dian)(dian)(dian)(dian)池負載的(de)(de)測試(shi)情況一(yi)樣。

　　圖4為兩(liang)個(ge)不同設置電(dian)(dian)壓：3V和4.1V時的(de)吸電(dian)(dian)流V-I曲(qu)線。兩(liang)個(ge)曲(qu)線的(de)動(dong)態電(dian)(dian)阻(用斜率表示)僅僅是(shi)由0.100Ω電(dian)(dian)阻模擬(ni)的(de)電(dian)(dian)池(chi)內(nei)阻。

　　圖3 根據圖2電池仿真電路繪制出的圖形，快速充電波形表明兩種條件下電池充電器的工作情況，分別是(shi)：CC階段(duan)提供1A (曲(qu)線(xian)B和D)和2A (曲(qu)線(xian)A和C)充電(dian)(dian)電(dian)(dian)流

　　圖4 圖2電路(lu)在電壓為(wei)4.1V (上(shang)部曲(qu)線(xian))和3V (下(xia)部曲(qu)線(xian))時的吸入電流，兩種情況(kuang)下(xia)斜率均代表0.1Ω內阻

　　由于鋰離子電池充電過程需要一小時或更長時間，利用實際負載測試鋰電池充電器將非常耗時，而且往往不切實際。為了加快電池充電器測試，本文介紹了一個簡單電路，用來模擬鋰離子電池。該電路提供了一個不使用實際電池對鋰電池充電器進行(xing)測(ce)試的有效(xiao)手段。