鋰離子(Li+)電池比其它化學類型的電池更脆弱，對于違規操作具有非常小的容限。因此，鋰(li)電池充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)路比較復雜，要求高(gao)精度電(dian)(dian)(dian)(dian)流(liu)、電(dian)(dian)(dian)(dian)壓(ya)設置(zhi)。如果無法滿足(zu)這些精度要求，充電(dian)(dian)(dian)(dian)器可能無法將電(dian)(dian)(dian)(dian)池(chi)完全充滿，進而降低電(dian)(dian)(dian)(dian)池(chi)壽(shou)命，或(huo)影響電(dian)(dian)(dian)(dian)池(chi)性能。

　　鑒于對Li+電池充電器的這些(xie)要(yao)求，對(dui)充(chong)(chong)電(dian)(dian)(dian)器(qi)(qi)設計進行(xing)完全測(ce)(ce)試(shi)(shi)并在整個工作范圍內進行(xing)分段測(ce)(ce)試(shi)(shi)非常重(zhong)要(yao)。然而，采用常規負載(zai)(即(ji)Li+電(dian)(dian)(dian)池(chi)(chi))測(ce)(ce)試(shi)(shi)Li+電(dian)(dian)(dian)池(chi)(chi)充(chong)(chong)電(dian)(dian)(dian)器(qi)(qi)將非常耗(hao)時，而且在實驗室和生產環境中也難于實現(xian)。為了簡化測(ce)(ce)試(shi)(shi)過(guo)程，本文給出了一個電(dian)(dian)(dian)池(chi)(chi)仿(fang)真電(dian)(dian)(dian)路，可加快測(ce)(ce)試(shi)(shi)速度(du)，在不帶實際電(dian)(dian)(dian)池(chi)(chi)的情況(kuang)下實現(xian)對(dui)鋰離(li)子(zi)電(dian)(dian)(dian)池(chi)(chi)充(chong)(chong)電(dian)(dian)(dian)器(qi)(qi)的測(ce)(ce)試(shi)(shi)。

　　CC-CV充電

　　鋰離子電(dian)池充(chong)電(dian)過程(cheng)的第一階段需(xu)要中等精度(du)的恒流(CC)充(chong)電(dian)，然后在第二階段過渡到高精度(du)恒壓(CV)充(chong)電(dian)。

　　圖1為用(yong)于鋰離子(zi)電(dian)池充(chong)電(dian)器的CC-CV集成電(dian)路(lu)(MAX1737)的V-I特性曲線。這種類型的IC是消費類產(chan)品中所有(you)鋰離子(zi)電(dian)池充(chong)電(dian)器的核心。圖中可(ke)清楚

　　看出CC (2.6V至(zhi)4.2V電(dian)池(chi)電(dian)壓)和CV (4.2V)區域。

　　圖1. MAX1737的V-I曲線是Li+電池充電器的標準特性曲線

　　電池低于2.6V時，需要采用不同的充電技術。如果試圖對放電至2.6V以下的電池充電，充電器須提供一個較低的(de)充(chong)(chong)電(dian)(dian)電(dian)(dian)流(“調理電(dian)(dian)流”)，將電(dian)(dian)池(chi)(chi)電(dian)(dian)壓充(chong)(chong)至2.6V。這是鋰(li)離子電(dian)(dian)池(chi)(chi)過(guo)放電(dian)(dian)時所必須采(cai)取的(de)安全機制。VBATT< 2.6V時強行(xing)進行(xing)快速充(chong)(chong)電(dian)(dian)，會使(shi)電(dian)(dian)池(chi)(chi)進入不可恢復的(de)短(duan)路狀態。

　　CC向CV階(jie)段的過渡點的臨界容差(cha)為± 40mV。之所以要求(qiu)如(ru)(ru)此嚴格的容差(cha)，是因(yin)為如(ru)(ru)果CV過低，電(dian)(dian)(dian)(dian)池將無(wu)法完全(quan)充(chong)(chong)滿;而CV過高，則(ze)會縮短電(dian)(dian)(dian)(dian)池的使用壽命。充(chong)(chong)電(dian)(dian)(dian)(dian)過程(cheng)終止意味著檢測到電(dian)(dian)(dian)(dian)池達到滿電(dian)(dian)(dian)(dian)量，充(chong)(chong)電(dian)(dian)(dian)(dian)器(qi)必須斷開或(huo)關閉。在CV階(jie)段，當(dang)檢測到充(chong)(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)降至快充(chong)(chong)電(dian)(dian)(dian)(dian)流(liu)或(huo)最(zui)大(da)充(chong)(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)的一定(ding)比例(通常< 10%)時終止充(chong)(chong)電(dian)(dian)(dian)(dian)。

　　Li+電池(chi)充電器參數(shu)測試

　　Li+電(dian)(dian)池充電(dian)(dian)器(qi)設計(ji)通(tong)常(chang)包括兩個基(ji)本部分：數字部分(控制(zhi)狀態機)和模(mo)擬(ni)部分，模(mo)擬(ni)部分包括帶有高精度(>1%)基(ji)準(zhun)、可精確控制(zhi)的(de)電(dian)(dian)流/電(dian)(dian)壓(ya)源。對(dui)鋰離子(zi)充電(dian)(dian)器(qi)(不(bu)(bu)僅(jin)指IC)進(jin)行完全測試(shi)是一項非常(chang)棘手且(qie)耗費(fei)時(shi)間的(de)工(gong)作，不(bu)(bu)僅(jin)僅(jin)限于對(dui)電(dian)(dian)流或電(dian)(dian)壓(ya)值(zhi)進(jin)行檢驗(yan)。

　　測試(shi)(shi)時(shi)(shi)，應該在整個工作(zuo)范圍(wei)對充(chong)電器(qi)進行分段檢(jian)測：包(bao)括CC階段、從CC到CV的(de)(de)切換、充(chong)電終止等。如上(shang)所述，測試(shi)(shi)的(de)(de)理想情況是(shi)采用(yong)常規充(chong)電器(qi)的(de)(de)負載：即(ji)Li+電池(chi)(chi)。然而，由于充(chong)電過程需(xu)要一小時(shi)(shi)甚(shen)至更長時(shi)(shi)間(jian)，使用(yong)鋰電池(chi)(chi)進行測試(shi)(shi)非常耗時(shi)(shi)。根據具體測試(shi)(shi)條件的(de)(de)不同：例如大(da)容量電池(chi)(chi)+慢速(su)充(chong)電，小容量電池(chi)(chi)+快速(su)充(chong)電以及(ji)其它可能組合，測試(shi)(shi)時(shi)(shi)間(jian)也不盡(jin)相同。

　　此外，充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)過(guo)程無法在保(bao)證(zheng)不損(sun)壞電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)的前提下(xia)提高充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)流，因(yin)為充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)流受電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)最大(da)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)速率(即快速充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)流)的制(zhi)約。對于消費類產品常用的電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)，很少(shao)規定電(dian)(dian)(dian)(dian)(dian)(dian)流大(da)于1C (在1小時(shi)(shi)內將(jiang)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)完(wan)(wan)全(quan)放電(dian)(dian)(dian)(dian)(dian)(dian)的電(dian)(dian)(dian)(dian)(dian)(dian)流)。因(yin)此，大(da)多(duo)數(shu)情況下(xia)完(wan)(wan)成(cheng)整個充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)周(zhou)期(qi)所需要的時(shi)(shi)間往(wang)往(wang)超過(guo)兩小時(shi)(shi)。如果需要重復(fu)測試，則需要將(jiang)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)完(wan)(wan)全(quan)放電(dian)(dian)(dian)(dian)(dian)(dian) ― 這一過(guo)程僅僅比充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)稍微(wei)短一些。或者，必須能夠隨時(shi)(shi)備有完(wan)(wan)全(quan)放電(dian)(dian)(dian)(dian)(dian)(dian)的電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)。

　　另外(wai)可以(yi)使(shi)用一(yi)個模擬的理想負(fu)(fu)載替代真(zhen)實電(dian)(dian)(dian)(dian)池(chi)(chi)進行負(fu)(fu)載測(ce)試(shi)。仿真(zhen)時，應驗證電(dian)(dian)(dian)(dian)路的直流響應和動(dong)態穩(wen)定性。然(ran)而，使(shi)用功率測(ce)試(shi)所用的標(biao)準(zhun)負(fu)(fu)載進行電(dian)(dian)(dian)(dian)池(chi)(chi)仿真(zhen)非常困難。與大多數電(dian)(dian)(dian)(dian)源測(ce)試(shi)使(shi)用的負(fu)(fu)載不同，電(dian)(dian)(dian)(dian)池(chi)(chi)不能簡(jian)單地當作(zuo)(zuo)電(dian)(dian)(dian)(dian)阻或(huo)固定地吸入電(dian)(dian)(dian)(dian)流。如上所述，必須在整個工作(zuo)(zuo)范(fan)圍內進行分段測(ce)試(shi)。以(yi)下介紹的Li+充電(dian)(dian)(dian)(dian)器測(ce)試(shi)電(dian)(dian)(dian)(dian)路完全滿足這些(xie)要求。

　　選擇電池模型負載

　　我們先討論兩個必須考慮但最終放棄的建模方法。電池負載建模的方法之一是：使用一個具有源出(放電)和吸入(充電)電流能力的電壓源與代表電池內阻的電阻串聯。由于Li+電池要求精確控制終止電壓和充電電流，目前所有Li+充電器實際上是穩(wen)壓電源轉換器。

　　此外，由于穩壓電源變換器(充電器)的穩定性取決于負載(電池)的動態特性，因此必須選擇一個與模型非常相似的負載。否則，測試只能驗證充電器本身的V-I特性。

　　如果只(zhi)是(shi)進(jin)行一次性測試，可以使用(yong)并(bing)聯型穩(wen)壓器與電(dian)(dian)阻串聯，這足以模(mo)(mo)擬電(dian)(dian)池(chi)的內(nei)(nei)阻，并(bing)且，這一簡單的電(dian)(dian)池(chi)模(mo)(mo)型完(wan)全(quan)可以滿足測試要求。這種方法的優勢是(shi)由充(chong)電(dian)(dian)器本身供電(dian)(dian)。然而，更(geng)(geng)嚴(yan)格的測試需要更(geng)(geng)精確的模(mo)(mo)型。該模(mo)(mo)型采用(yong)內(nei)(nei)部(bu)電(dian)(dian)壓源(yuan)，電(dian)(dian)壓值是(shi)充(chong)電(dian)(dian)過程中(zhong)供給電(dian)(dian)池(chi)的總電(dian)(dian)荷的函數。

　　用恒流源對電(dian)(dian)池充電(dian)(dian)時電(dian)(dian)壓(ya)將不斷變(bian)化(hua)，以(yi)(yi)一定的(de)(de)正(zheng)斜率上升。這是由(you)于(yu)放(fang)電(dian)(dian)和其它電(dian)(dian)池內部(bu)化(hua)學變(bian)化(hua)過程中，電(dian)(dian)池正(zheng)極(ji)周圍累積的(de)(de)極(ji)化(hua)離子逐漸減少。因此，充電(dian)(dian)器的(de)(de)工(gong)作點取決于(yu)電(dian)(dian)池連(lian)接時間(jian)的(de)(de)長短，以(yi)(yi)及電(dian)(dian)池的(de)(de)工(gong)作歷史。用大(da)多數電(dian)(dian)子實驗室能夠找到(dao)的(de)(de)通用器件(jian)構(gou)建負載，以(yi)(yi)模(mo)擬這一復雜(za)負載的(de)(de)模(mo)型很困難。

　　需(xu)要(yao)經常(chang)對(dui)充電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)路進(jin)(jin)行測試(shi)，或(huo)必須詳細描(miao)述電(dian)(dian)(dian)(dian)(dian)路特性時(shi)(shi)，準確模擬(ni)充電(dian)(dian)(dian)(dian)(dian)過程的電(dian)(dian)(dian)(dian)(dian)池(chi)非常(chang)有用。模擬(ni)過程需(xu)要(yao)連續掃描(miao)充電(dian)(dian)(dian)(dian)(dian)器(qi)的所有直流工作點。模擬(ni)電(dian)(dian)(dian)(dian)(dian)路還要(yao)顯示結果(guo)，使(shi)操(cao)作人(ren)員可以(yi)查找問(wen)題、故障和干擾。如果(guo)模擬(ni)電(dian)(dian)(dian)(dian)(dian)路能夠提(ti)供電(dian)(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)(dian)壓輸出和信號，這(zhe)些結果(guo)可以(yi)直接(jie)作為示波(bo)器(qi)信號。測試(shi)速(su)(su)度(du)可以(yi)加快(kuai)(從幾(ji)小時(shi)(shi)到數(shu)十秒)，并(bing)可根據需(xu)要(yao)進(jin)(jin)行多(duo)次(ci)反復，比用真(zhen)正的電(dian)(dian)(dian)(dian)(dian)池(chi)測試(shi)更方便(bian)。然而，測試(shi)速(su)(su)度(du)加快(kuai)后對(dui)確定充電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)源(yuan)(yuan)的熱(re)(re)效應不利。因此，可能需(xu)要(yao)額(e)外的長時(shi)(shi)間(jian)測試(shi)，以(yi)便(bian)與充電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)源(yuan)(yuan)和調節電(dian)(dian)(dian)(dian)(dian)路的熱(re)(re)時(shi)(shi)間(jian)常(chang)數(shu)相吻合。

　　 建(jian)立(li)電池模型負(fu)載

　　圖(tu)(tu)2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)模(mo)擬的是(shi)單節鋰(li)離(li)子電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)。充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)CC階段(duan)的終(zhong)止充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)和快速充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)由充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)設置決定。仿真(zhen)器(qi)初始(shi)(shi)化時，可(ke)設置完(wan)(wan)全(quan)放(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)條件下內(nei)部電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)為3V，但該電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)可(ke)以提升到4.3V，以測試(shi)過充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)情況。3V初始(shi)(shi)值通常(chang)用于(yu)低電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)關斷電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(用來終(zhong)止鋰(li)離(li)子電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)放(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)過程)。這種設計專門針(zhen)對終(zhong)止充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)為4.2V的標準(zhun)CC-CV鋰(li)離(li)子電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)。該設計調整起來很(hen)容易，能夠適(shi)應非標準(zhun)終(zhong)止電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)和完(wan)(wan)全(quan)放(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)的測試(shi)。測試(shi)時充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)用高達3A的充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)驅動仿真(zhen)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)，受功率晶體管功耗的限制。圖(tu)(tu)2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)模(mo)擬了電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)增(zeng)加的情況，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)是(shi)從仿真(zhen)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)設置為完(wan)(wan)全(quan)放(fang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)狀態開始(shi)(shi)，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)充(chong)(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)的函數。

　　根據圖中給(gei)出的(de)參數值，充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流為1A時，積分時間常(chang)數使模(mo)擬電(dian)(dian)(dian)(dian)路在(zai)6至(zhi)7秒內達(da)到充(chong)電(dian)(dian)(dian)(dian)器的(de)4.2V限制。對電(dian)(dian)(dian)(dian)流范圍、內阻、充(chong)電(dian)(dian)(dian)(dian)終止電(dian)(dian)(dian)(dian)壓(ya)(ya)和完全放電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)壓(ya)(ya)的(de)模(mo)擬是在(zai)鋰(li)離子電(dian)(dian)(dian)(dian)池(chi)(本(ben)例(li)中指Sony US18650G3)典型參數的(de)基(ji)礎(chu)上(shang)完成(cheng)的(de)。所仿真(zhen)的(de)電(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)壓(ya)(ya)沒有(you)考(kao)慮(lv)環境溫度的(de)影(ying)響。

　　圖2 單節(jie)Li+電(dian)(dian)池充電(dian)(dian)情況的仿真(zhen)電(dian)(dian)路，該電(dian)(dian)路可以在不使用實際電(dian)(dian)池的情況下測試(shi)Li+電(dian)(dian)池充電(dian)(dian)器

　　并聯(lian)穩壓(ya)器(qi)(qi)設計采(cai)用MAX8515并聯(lian)穩壓(ya)器(qi)(qi)和(he)一對雙(shuang)極型功率晶體管(選擇該穩壓(ya)器(qi)(qi)時考慮(lv)了其內部基準電壓(ya)的(de)精度)，大電流TIP35晶體管安裝在能夠耗散25W熱(re)量的(de)散熱(re)器(qi)(qi)上。

　　MAX4163雙(shuang)運放的(de)其中(zhong)一(yi)個放大(da)(da)器(qi)用來對(dui)充電(dian)電(dian)流積分，另一(yi)個放大(da)(da)器(qi)對(dui)電(dian)流測量信號(hao)進(jin)行放大(da)(da)和偏置。該運算放大(da)(da)器(qi)具有較高的(de)電(dian)源抑(yi)制比，并(bing)可支持滿擺幅輸入/輸出(chu)范圍，簡化了兩種功能電(dian)路(lu)的(de)設計。注意，與電(dian)池仿真(zhen)器(qi)正端串聯(lian)的(de)0.100Ω電(dian)流檢測電(dian)阻同時(shi)也作為(wei)電(dian)池內阻。

　　在具有(you)自動(dong)測試-數(shu)據采集(ji)功能(neng)的系統(tong)內工(gong)作時，可用外(wai)部信號將仿真(zhen)電(dian)池復位到完全放電(dian)狀(zhuang)態。另外(wai)，手動(dong)操作測試設置時，可用按鍵復位。

　　利用單(dan)刀(dao)單(dan)擲開關(guan)(guan)可以選擇(ze)仿(fang)真(zhen)(zhen)電(dian)池(chi)的(de)兩種(zhong)工作(zuo)模式。擲向(xiang)A端(duan)時(shi)，實(shi)現積分充電(dian)仿(fang)真(zhen)(zhen)器(qi)，如(ru)上所(suo)述。擲向(xiang)B端(duan)時(shi)，仿(fang)真(zhen)(zhen)器(qi)將設(she)定(ding)在(zai)某一固定(ding)的(de)直流(liu)(liu)工作(zuo)點(dian)對充電(dian)器(qi)進(jin)行(xing)現場測(ce)試時(shi)的(de)輸(shu)出(chu)(chu)電(dian)壓(ya)(ya)和吸(xi)電(dian)流(liu)(liu)。為實(shi)現這一功能，“設(she)置”電(dian)壓(ya)(ya)可通過改(gai)變50kΩ可變電(dian)阻(zu)，在(zai)2.75V至(zhi)5.75V之間(jian)手動(dong)調整。這些設(she)置電(dian)壓(ya)(ya)值與內部吸(xi)入電(dian)流(liu)(liu)有(you)關(guan)(guan)。仿(fang)真(zhen)(zhen)器(qi)端(duan)實(shi)測(ce)電(dian)壓(ya)(ya)(VBATT)等于設(she)定(ding)電(dian)壓(ya)(ya)加上吸(xi)電(dian)流(liu)(liu)流(liu)(liu)經仿(fang)真(zhen)(zhen)電(dian)池(chi)內阻(zu)(0.100Ω電(dian)阻(zu))產生的(de)壓(ya)(ya)降。仿(fang)真(zhen)(zhen)電(dian)路(lu)工作(zuo)時(shi)的(de)電(dian)源(yuan)取自電(dian)池(chi)充電(dian)器(qi)輸(shu)出(chu)(chu)。

　　仿真電路的性能

　　圖3為(wei)模(mo)擬鋰(li)離(li)子電(dian)(dian)(dian)池(chi)(chi)充(chong)(chong)(chong)電(dian)(dian)(dian)至4.2V時(shi)獲得(de)的典型V-I波(bo)形。從(cong)圖中可以(yi)看出兩(liang)個測(ce)試(shi)過程：一(yi)個是(shi)以(yi)1A初始快充(chong)(chong)(chong)電(dian)(dian)(dian)流充(chong)(chong)(chong)電(dian)(dian)(dian)(曲線B和(he)D)，另(ling)一(yi)個是(shi)以(yi)2A快充(chong)(chong)(chong)電(dian)(dian)(dian)流充(chong)(chong)(chong)電(dian)(dian)(dian)(曲線A和(he)C)。這兩(liang)種情況(kuang)下，首先(xian)進入(ru)CC階段(duan)充(chong)(chong)(chong)電(dian)(dian)(dian)，直到(dao)電(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)壓達到(dao)終止(zhi)電(dian)(dian)(dian)壓4.2V。在此之后，電(dian)(dian)(dian)流呈指(zhi)數衰減，而仿真電(dian)(dian)(dian)池(chi)(chi)的電(dian)(dian)(dian)壓保持不變。充(chong)(chong)(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)流為(wei)2A時(shi)到(dao)達終止(zhi)電(dian)(dian)(dian)壓所(suo)需的時(shi)間更短，與預期設計相同。然而，請注意(yi)，電(dian)(dian)(dian)流加(jia)倍不會使(shi)充(chong)(chong)(chong)電(dian)(dian)(dian)時(shi)間減半(ban)，只會使(shi)到(dao)達CV模(mo)式(shi)的時(shi)間減半(ban)，與真實電(dian)(dian)(dian)池(chi)(chi)負載的測(ce)試(shi)情況(kuang)一(yi)樣。

　　圖4為兩個不同設(she)置電(dian)壓：3V和4.1V時的(de)吸電(dian)流V-I曲線。兩個曲線的(de)動態電(dian)阻(zu)(用斜率表示(shi))僅(jin)(jin)僅(jin)(jin)是由(you)0.100Ω電(dian)阻(zu)模(mo)擬的(de)電(dian)池(chi)內(nei)阻(zu)。

　　圖3 根據圖2電池仿真電路繪制出的圖形，快速充電波形表明兩種條件下電池充電器的(de)工作情況，分別是：CC階段提供1A (曲線(xian)B和(he)D)和(he)2A (曲線(xian)A和(he)C)充電電流

　　圖4 圖2電(dian)路在電(dian)壓為4.1V (上部(bu)曲(qu)線)和3V (下部(bu)曲(qu)線)時(shi)的吸入電(dian)流，兩種情(qing)況下斜率均代表0.1Ω內阻

　　由于鋰離子電池充電過程需要一小時或更長時間，利用實際負載測試鋰電池充電器將非常耗時，而且往往不切實際。為了加快電池充電器測試，本文介紹了一個簡單電路，用來模擬鋰離子電池。該電路提供了一個不使用實際電池對鋰電池充電器進行測試的有(you)效手段。