鋰離子(Li+)電池比其它化學類型的電池更脆弱，對于違規操作具有非常小的容限。因此，鋰電池(chi)充電(dian)電(dian)路比較復雜，要求(qiu)高精度電(dian)流、電(dian)壓設置。如果(guo)無(wu)法滿足這些精度要求(qiu)，充電(dian)器可(ke)能(neng)無(wu)法將電(dian)池完全充滿，進而降(jiang)低電(dian)池壽(shou)命(ming)，或(huo)影響電(dian)池性能(neng)。

　　鑒于對Li+電池充電器的(de)(de)這些(xie)要(yao)求，對(dui)充(chong)電(dian)(dian)器設(she)計進行完全測(ce)試(shi)并(bing)在(zai)整個(ge)工作范(fan)圍內進行分段測(ce)試(shi)非常(chang)(chang)重要(yao)。然而，采用常(chang)(chang)規負載(即Li+電(dian)(dian)池(chi)(chi))測(ce)試(shi)Li+電(dian)(dian)池(chi)(chi)充(chong)電(dian)(dian)器將非常(chang)(chang)耗時，而且在(zai)實(shi)(shi)驗(yan)室和生產環境中(zhong)也難于實(shi)(shi)現。為了簡化測(ce)試(shi)過程(cheng)，本文(wen)給出(chu)了一個(ge)電(dian)(dian)池(chi)(chi)仿真電(dian)(dian)路，可(ke)加快測(ce)試(shi)速度，在(zai)不(bu)帶實(shi)(shi)際電(dian)(dian)池(chi)(chi)的(de)(de)情況下實(shi)(shi)現對(dui)鋰離子(zi)電(dian)(dian)池(chi)(chi)充(chong)電(dian)(dian)器的(de)(de)測(ce)試(shi)。

　　CC-CV充電

　　鋰(li)離子電池(chi)充(chong)電過(guo)(guo)程的第一階段需(xu)要中(zhong)等精度的恒流(CC)充(chong)電，然后(hou)在第二(er)階段過(guo)(guo)渡到高精度恒壓(CV)充(chong)電。

　　圖(tu)1為用于鋰(li)離(li)(li)子電池(chi)充(chong)電器的(de)CC-CV集成電路(MAX1737)的(de)V-I特(te)性曲線。這(zhe)種類型的(de)IC是(shi)消費類產品中所有鋰(li)離(li)(li)子電池(chi)充(chong)電器的(de)核心(xin)。圖(tu)中可清楚

　　看出CC (2.6V至4.2V電池電壓)和(he)CV (4.2V)區域。

　　圖1. MAX1737的V-I曲線是Li+電池充電器的標準特性曲線

　　電池低于2.6V時，需要采用不同的充電技術。如果試圖對放電至2.6V以下的電池充電，充電器須提供一個較低的(de)充電電流(“調(diao)理電流”)，將電池電壓充至2.6V。這(zhe)是鋰(li)離(li)子(zi)電池過放電時(shi)所必須采取的(de)安全機制(zhi)。VBATT< 2.6V時(shi)強(qiang)行(xing)進(jin)行(xing)快(kuai)速充電，會使(shi)電池進(jin)入不可恢復的(de)短路狀(zhuang)態(tai)。

　　CC向CV階段的過(guo)(guo)渡點的臨界容差為± 40mV。之(zhi)所(suo)以要求如此嚴(yan)格的容差，是因為如果(guo)CV過(guo)(guo)低(di)，電(dian)池將無法完全充滿;而CV過(guo)(guo)高(gao)，則會縮(suo)短電(dian)池的使用(yong)壽命(ming)。充電(dian)過(guo)(guo)程終(zhong)止意(yi)味著檢(jian)測到(dao)電(dian)池達到(dao)滿電(dian)量，充電(dian)器必須斷(duan)開或關(guan)閉(bi)。在CV階段，當檢(jian)測到(dao)充電(dian)電(dian)流(liu)降至快充電(dian)流(liu)或最大充電(dian)電(dian)流(liu)的一定比例(通常< 10%)時終(zhong)止充電(dian)。

　　Li+電池充電器參數測(ce)試(shi)

　　Li+電(dian)池充(chong)(chong)電(dian)器(qi)設計(ji)通常(chang)包括(kuo)兩個基本部(bu)(bu)分：數字(zi)部(bu)(bu)分(控制狀態(tai)機)和模擬部(bu)(bu)分，模擬部(bu)(bu)分包括(kuo)帶有高精(jing)度(du)(>1%)基準、可(ke)精(jing)確控制的(de)電(dian)流(liu)/電(dian)壓源(yuan)。對鋰離子(zi)充(chong)(chong)電(dian)器(qi)(不僅(jin)指(zhi)IC)進行(xing)(xing)完全測試是一項非常(chang)棘手且耗費(fei)時間的(de)工作，不僅(jin)僅(jin)限于對電(dian)流(liu)或電(dian)壓值進行(xing)(xing)檢(jian)驗(yan)。

　　測(ce)試時(shi)，應(ying)該在整個工(gong)作范圍(wei)對充電(dian)器(qi)進(jin)行(xing)分段檢測(ce)：包(bao)括CC階段、從CC到CV的(de)(de)切換(huan)、充電(dian)終(zhong)止等。如上所(suo)述，測(ce)試的(de)(de)理想情(qing)況是(shi)采用常規充電(dian)器(qi)的(de)(de)負載：即Li+電(dian)池(chi)(chi)。然而，由于充電(dian)過程(cheng)需要一小時(shi)甚(shen)至更長時(shi)間，使用鋰電(dian)池(chi)(chi)進(jin)行(xing)測(ce)試非常耗時(shi)。根據(ju)具體測(ce)試條(tiao)件的(de)(de)不(bu)同：例如大容(rong)(rong)量(liang)電(dian)池(chi)(chi)+慢速(su)充電(dian)，小容(rong)(rong)量(liang)電(dian)池(chi)(chi)+快速(su)充電(dian)以及其它可(ke)能組合(he)，測(ce)試時(shi)間也不(bu)盡(jin)相同。

　　此(ci)外，充(chong)電(dian)(dian)(dian)(dian)(dian)過(guo)程無法在保(bao)證不損(sun)壞電(dian)(dian)(dian)(dian)(dian)池的(de)(de)(de)前提下提高充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流，因為充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流受電(dian)(dian)(dian)(dian)(dian)池最大充(chong)電(dian)(dian)(dian)(dian)(dian)速率(即(ji)快速充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流)的(de)(de)(de)制約。對于消費類(lei)產品常(chang)用的(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)池，很少規定電(dian)(dian)(dian)(dian)(dian)流大于1C (在1小(xiao)時(shi)內將電(dian)(dian)(dian)(dian)(dian)池完(wan)全放電(dian)(dian)(dian)(dian)(dian)的(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)流)。因此(ci)，大多數情況下完(wan)成整個充(chong)電(dian)(dian)(dian)(dian)(dian)周期所需(xu)要的(de)(de)(de)時(shi)間(jian)往往超過(guo)兩小(xiao)時(shi)。如果需(xu)要重復(fu)測試，則需(xu)要將電(dian)(dian)(dian)(dian)(dian)池完(wan)全放電(dian)(dian)(dian)(dian)(dian) ― 這一過(guo)程僅僅比充(chong)電(dian)(dian)(dian)(dian)(dian)稍微(wei)短(duan)一些。或(huo)者(zhe)，必須能夠隨時(shi)備有完(wan)全放電(dian)(dian)(dian)(dian)(dian)的(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)池。

　　另外可(ke)以使(shi)用(yong)一個模擬的(de)理想負(fu)(fu)(fu)載(zai)(zai)替代真實電(dian)池(chi)(chi)進(jin)行負(fu)(fu)(fu)載(zai)(zai)測(ce)試(shi)。仿真時，應驗證(zheng)電(dian)路的(de)直流響應和動態穩定(ding)性。然而，使(shi)用(yong)功率測(ce)試(shi)所(suo)用(yong)的(de)標準負(fu)(fu)(fu)載(zai)(zai)進(jin)行電(dian)池(chi)(chi)仿真非(fei)常困難。與大多數電(dian)源(yuan)測(ce)試(shi)使(shi)用(yong)的(de)負(fu)(fu)(fu)載(zai)(zai)不同(tong)，電(dian)池(chi)(chi)不能(neng)簡單地當作電(dian)阻或固(gu)定(ding)地吸入電(dian)流。如上(shang)所(suo)述，必須在整個工(gong)作范圍內進(jin)行分(fen)段測(ce)試(shi)。以下介紹(shao)的(de)Li+充電(dian)器測(ce)試(shi)電(dian)路完全(quan)滿足這些要求。

　　選擇電池模型負載(zai)

　　我們先討論兩個必須考慮但最終放棄的建模方法。電池負載建模的方法之一是：使用一個具有源出(放電)和吸入(充電)電流能力的電壓源與代表電池內阻的電阻串聯。由于Li+電池要求精確控制終止電壓和充電電流，目前所有Li+充電器實(shi)際上是穩(wen)壓(ya)電源轉換器。

　　此外，由于穩壓電源變換器(充電器)的穩定性取決于負載(電池)的動態特性，因此必須選擇一個與模型非常相似的負載。否則，測試只能驗證充電器本身的V-I特性。

　　如果只是進行一(yi)次性(xing)測試(shi)，可以(yi)使用并聯型(xing)穩(wen)壓(ya)(ya)器與電阻串聯，這足(zu)以(yi)模(mo)擬電池(chi)(chi)的內(nei)阻，并且，這一(yi)簡單的電池(chi)(chi)模(mo)型(xing)完全可以(yi)滿足(zu)測試(shi)要求。這種方(fang)法的優勢是由充電器本(ben)身(shen)供電。然(ran)而，更嚴(yan)格(ge)的測試(shi)需要更精確的模(mo)型(xing)。該模(mo)型(xing)采用內(nei)部電壓(ya)(ya)源，電壓(ya)(ya)值是充電過程中供給(gei)電池(chi)(chi)的總(zong)電荷的函(han)數。

　　用(yong)恒流源對電(dian)池(chi)充電(dian)時電(dian)壓將不斷(duan)變(bian)化，以(yi)(yi)一定的(de)(de)正斜率上升。這是由于(yu)放電(dian)和其(qi)它電(dian)池(chi)內部化學變(bian)化過(guo)程中，電(dian)池(chi)正極(ji)周圍累積的(de)(de)極(ji)化離子逐漸減少。因此，充電(dian)器(qi)的(de)(de)工作點取決于(yu)電(dian)池(chi)連接(jie)時間(jian)的(de)(de)長短，以(yi)(yi)及電(dian)池(chi)的(de)(de)工作歷史。用(yong)大(da)多(duo)數電(dian)子實(shi)驗室(shi)能夠找(zhao)到的(de)(de)通用(yong)器(qi)件構建負載，以(yi)(yi)模擬這一復雜負載的(de)(de)模型很困難。

　　需(xu)要(yao)經常(chang)對充(chong)(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)路進行(xing)測試(shi)，或(huo)必須詳細描述電(dian)(dian)(dian)路特性時，準確(que)模(mo)(mo)擬充(chong)(chong)電(dian)(dian)(dian)過(guo)程(cheng)的(de)電(dian)(dian)(dian)池非常(chang)有用。模(mo)(mo)擬過(guo)程(cheng)需(xu)要(yao)連續掃描充(chong)(chong)電(dian)(dian)(dian)器的(de)所有直流工作(zuo)點。模(mo)(mo)擬電(dian)(dian)(dian)路還要(yao)顯示結果，使操作(zuo)人(ren)員可以(yi)查找問題、故(gu)障(zhang)和干擾。如果模(mo)(mo)擬電(dian)(dian)(dian)路能夠提供電(dian)(dian)(dian)池電(dian)(dian)(dian)壓輸出和信號，這些結果可以(yi)直接作(zuo)為示波器信號。測試(shi)速度可以(yi)加(jia)快(從幾小時到(dao)數(shu)十(shi)秒(miao))，并可根據需(xu)要(yao)進行(xing)多次反復，比用真(zhen)正的(de)電(dian)(dian)(dian)池測試(shi)更方便。然而(er)，測試(shi)速度加(jia)快后(hou)對確(que)定充(chong)(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)源的(de)熱效應不利。因此，可能需(xu)要(yao)額(e)外的(de)長時間(jian)測試(shi)，以(yi)便與(yu)充(chong)(chong)電(dian)(dian)(dian)電(dian)(dian)(dian)源和調節電(dian)(dian)(dian)路的(de)熱時間(jian)常(chang)數(shu)相吻合。

　　 建立電(dian)池模型負載

　　圖2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)模(mo)擬的(de)(de)是(shi)單(dan)節鋰(li)離子電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)。充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器CC階(jie)段的(de)(de)終(zhong)(zhong)止(zhi)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)和快速(su)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流由充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器設(she)置(zhi)決定。仿(fang)真(zhen)器初(chu)始化時，可設(she)置(zhi)完全放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)條(tiao)件下內部電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)為(wei)3V，但該電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)可以(yi)提升到(dao)4.3V，以(yi)測(ce)試(shi)過充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)情況。3V初(chu)始值通常(chang)用于低電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)關(guan)斷電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(用來(lai)終(zhong)(zhong)止(zhi)鋰(li)離子電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)過程)。這種設(she)計專(zhuan)門針對(dui)終(zhong)(zhong)止(zhi)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)為(wei)4.2V的(de)(de)標準CC-CV鋰(li)離子電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器。該設(she)計調整起來(lai)很容(rong)易，能夠適應非標準終(zhong)(zhong)止(zhi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)和完全放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)的(de)(de)測(ce)試(shi)。測(ce)試(shi)時充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器用高達3A的(de)(de)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流驅(qu)動仿(fang)真(zhen)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)，受功率晶(jing)體管功耗的(de)(de)限制。圖2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)模(mo)擬了電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)增加的(de)(de)情況，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)是(shi)從(cong)仿(fang)真(zhen)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)設(she)置(zhi)為(wei)完全放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)狀態開始，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)充(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流的(de)(de)函(han)數。

　　根據(ju)圖中給出(chu)的(de)參(can)數(shu)值，充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)為1A時(shi)，積分時(shi)間常數(shu)使模擬電(dian)(dian)(dian)(dian)路在6至7秒內達(da)到充(chong)電(dian)(dian)(dian)(dian)器的(de)4.2V限制。對電(dian)(dian)(dian)(dian)流(liu)范圍(wei)、內阻、充(chong)電(dian)(dian)(dian)(dian)終(zhong)止電(dian)(dian)(dian)(dian)壓(ya)和(he)完全放電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)壓(ya)的(de)模擬是在鋰離子電(dian)(dian)(dian)(dian)池(本例中指Sony US18650G3)典型參(can)數(shu)的(de)基(ji)礎上(shang)完成的(de)。所(suo)仿(fang)真(zhen)的(de)電(dian)(dian)(dian)(dian)池電(dian)(dian)(dian)(dian)壓(ya)沒有考(kao)慮環境溫度的(de)影(ying)響。

　　圖2 單節(jie)Li+電(dian)池(chi)充(chong)(chong)電(dian)情況的仿(fang)真(zhen)電(dian)路(lu)，該電(dian)路(lu)可以在不使用實際電(dian)池(chi)的情況下(xia)測(ce)試Li+電(dian)池(chi)充(chong)(chong)電(dian)器

　　并聯(lian)穩(wen)(wen)壓(ya)器設計采用MAX8515并聯(lian)穩(wen)(wen)壓(ya)器和一對雙極型功率晶體管(選擇該(gai)穩(wen)(wen)壓(ya)器時(shi)考慮了其(qi)內部基準(zhun)電(dian)壓(ya)的(de)(de)精度)，大電(dian)流TIP35晶體管安(an)裝在能夠耗散(san)25W熱量的(de)(de)散(san)熱器上。

　　MAX4163雙運放(fang)的(de)(de)其中一個(ge)放(fang)大器(qi)用來(lai)對充電(dian)(dian)電(dian)(dian)流積分(fen)，另一個(ge)放(fang)大器(qi)對電(dian)(dian)流測(ce)量信(xin)號進行放(fang)大和偏置。該運算放(fang)大器(qi)具(ju)有較(jiao)高的(de)(de)電(dian)(dian)源抑制比，并可支持滿(man)擺(bai)幅輸入/輸出范圍，簡化了兩種功能電(dian)(dian)路的(de)(de)設計。注意(yi)，與電(dian)(dian)池仿真(zhen)器(qi)正端(duan)串聯(lian)的(de)(de)0.100Ω電(dian)(dian)流檢測(ce)電(dian)(dian)阻同時也作為電(dian)(dian)池內阻。

　　在(zai)具有自動測試(shi)-數(shu)據采集功能的系統內工作時，可用外部信號將仿真電池(chi)復位到(dao)完(wan)全放電狀(zhuang)態。另外，手(shou)動操作測試(shi)設置時，可用按鍵復位。

　　利用單刀單擲(zhi)(zhi)開關(guan)可(ke)以(yi)選(xuan)擇仿真(zhen)(zhen)電(dian)(dian)(dian)池的(de)(de)兩(liang)種工(gong)作(zuo)(zuo)模(mo)式。擲(zhi)(zhi)向A端(duan)(duan)時，實(shi)(shi)現(xian)積分充電(dian)(dian)(dian)仿真(zhen)(zhen)器(qi)，如上所述(shu)。擲(zhi)(zhi)向B端(duan)(duan)時，仿真(zhen)(zhen)器(qi)將設定(ding)(ding)在(zai)某一固定(ding)(ding)的(de)(de)直流(liu)(liu)工(gong)作(zuo)(zuo)點對(dui)充電(dian)(dian)(dian)器(qi)進行(xing)現(xian)場(chang)測(ce)試時的(de)(de)輸(shu)出電(dian)(dian)(dian)壓(ya)和吸電(dian)(dian)(dian)流(liu)(liu)。為實(shi)(shi)現(xian)這一功能，“設置(zhi)”電(dian)(dian)(dian)壓(ya)可(ke)通過改變50kΩ可(ke)變電(dian)(dian)(dian)阻，在(zai)2.75V至(zhi)5.75V之間手動調(diao)整(zheng)。這些設置(zhi)電(dian)(dian)(dian)壓(ya)值與內(nei)部吸入電(dian)(dian)(dian)流(liu)(liu)有(you)關(guan)。仿真(zhen)(zhen)器(qi)端(duan)(duan)實(shi)(shi)測(ce)電(dian)(dian)(dian)壓(ya)(VBATT)等于設定(ding)(ding)電(dian)(dian)(dian)壓(ya)加上吸電(dian)(dian)(dian)流(liu)(liu)流(liu)(liu)經仿真(zhen)(zhen)電(dian)(dian)(dian)池內(nei)阻(0.100Ω電(dian)(dian)(dian)阻)產(chan)生的(de)(de)壓(ya)降。仿真(zhen)(zhen)電(dian)(dian)(dian)路工(gong)作(zuo)(zuo)時的(de)(de)電(dian)(dian)(dian)源取自電(dian)(dian)(dian)池充電(dian)(dian)(dian)器(qi)輸(shu)出。

　　仿真電路的性能

　　圖3為模擬(ni)鋰離子電(dian)(dian)(dian)(dian)(dian)池(chi)充(chong)電(dian)(dian)(dian)(dian)(dian)至4.2V時獲得的(de)典(dian)型V-I波形。從圖中可以(yi)(yi)看出兩個(ge)測(ce)試(shi)過(guo)程：一個(ge)是(shi)以(yi)(yi)1A初始快充(chong)電(dian)(dian)(dian)(dian)(dian)流(liu)充(chong)電(dian)(dian)(dian)(dian)(dian)(曲線B和D)，另一個(ge)是(shi)以(yi)(yi)2A快充(chong)電(dian)(dian)(dian)(dian)(dian)流(liu)充(chong)電(dian)(dian)(dian)(dian)(dian)(曲線A和C)。這(zhe)兩種情況下，首先(xian)進(jin)入CC階段充(chong)電(dian)(dian)(dian)(dian)(dian)，直到電(dian)(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)(dian)壓達(da)到終(zhong)止電(dian)(dian)(dian)(dian)(dian)壓4.2V。在此之后，電(dian)(dian)(dian)(dian)(dian)流(liu)呈(cheng)指數衰減(jian)，而仿(fang)真(zhen)電(dian)(dian)(dian)(dian)(dian)池(chi)的(de)電(dian)(dian)(dian)(dian)(dian)壓保持不(bu)變(bian)。充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流(liu)為2A時到達(da)終(zhong)止電(dian)(dian)(dian)(dian)(dian)壓所需的(de)時間更短，與(yu)預(yu)期設計相(xiang)同。然而，請注(zhu)意，電(dian)(dian)(dian)(dian)(dian)流(liu)加倍(bei)不(bu)會(hui)使充(chong)電(dian)(dian)(dian)(dian)(dian)時間減(jian)半，只會(hui)使到達(da)CV模式的(de)時間減(jian)半，與(yu)真(zhen)實電(dian)(dian)(dian)(dian)(dian)池(chi)負載的(de)測(ce)試(shi)情況一樣(yang)。

　　圖4為兩(liang)個(ge)不(bu)同設置(zhi)電壓(ya)：3V和4.1V時的(de)吸電流V-I曲線(xian)。兩(liang)個(ge)曲線(xian)的(de)動態電阻(用斜率(lv)表(biao)示)僅僅是由0.100Ω電阻模擬(ni)的(de)電池內阻。

　　圖3 根據圖2電池仿真電路繪制出的圖形，快速充電波形表明兩種條件下電池充電器的工作情況，分別是：CC階段提(ti)供1A (曲線B和(he)D)和(he)2A (曲線A和(he)C)充電電流

　　圖4 圖2電(dian)路在電(dian)壓為4.1V (上部(bu)曲線(xian))和3V (下(xia)部(bu)曲線(xian))時的吸入(ru)電(dian)流，兩種情況(kuang)下(xia)斜率均代表(biao)0.1Ω內阻

　　由于鋰離子電池充電過程需要一小時或更長時間，利用實際負載測試鋰電池充電器將非常耗時，而且往往不切實際。為了加快電池充電器測試，本文介紹了一個簡單電路，用來模擬鋰離子電池。該電路提供了一個不使用實際電池對鋰電池充電器進行測試的有效手段。