鋰離子(Li+)電池比其它化學類型的電池更脆弱，對于違規操作具有非常小的容限。因此，鋰電池充電(dian)(dian)電(dian)(dian)路比較復雜，要求高精(jing)度(du)電(dian)(dian)流、電(dian)(dian)壓設置。如果(guo)無(wu)法滿足這(zhe)些精(jing)度(du)要求，充電(dian)(dian)器可(ke)能無(wu)法將電(dian)(dian)池(chi)完全充滿，進而(er)降低電(dian)(dian)池(chi)壽命，或影響電(dian)(dian)池(chi)性能。

　　鑒于對Li+電池充電器的這些要求(qiu)，對充電(dian)(dian)(dian)器(qi)設計進行完全(quan)測(ce)(ce)試(shi)(shi)(shi)并(bing)在(zai)(zai)整(zheng)個(ge)工作范圍內進行分(fen)段測(ce)(ce)試(shi)(shi)(shi)非(fei)常重要。然而，采用常規負載(即Li+電(dian)(dian)(dian)池)測(ce)(ce)試(shi)(shi)(shi)Li+電(dian)(dian)(dian)池充電(dian)(dian)(dian)器(qi)將非(fei)常耗(hao)時，而且(qie)在(zai)(zai)實驗(yan)室和生產環境(jing)中也難于實現。為了簡化測(ce)(ce)試(shi)(shi)(shi)過程，本文(wen)給(gei)出了一(yi)個(ge)電(dian)(dian)(dian)池仿真電(dian)(dian)(dian)路，可加快(kuai)測(ce)(ce)試(shi)(shi)(shi)速度，在(zai)(zai)不帶實際電(dian)(dian)(dian)池的情況下實現對鋰(li)離子電(dian)(dian)(dian)池充電(dian)(dian)(dian)器(qi)的測(ce)(ce)試(shi)(shi)(shi)。

　　CC-CV充電

　　鋰離子電(dian)池充(chong)電(dian)過程的第(di)一階段需要中等精度的恒流(CC)充(chong)電(dian)，然后在(zai)第(di)二階段過渡到高(gao)精度恒壓(CV)充(chong)電(dian)。

　　圖1為用(yong)于鋰離(li)子電(dian)(dian)池充電(dian)(dian)器(qi)的CC-CV集成(cheng)電(dian)(dian)路(MAX1737)的V-I特性曲線。這種類型的IC是消(xiao)費類產品中(zhong)(zhong)所有鋰離(li)子電(dian)(dian)池充電(dian)(dian)器(qi)的核心。圖中(zhong)(zhong)可清楚(chu)

　　看出CC (2.6V至4.2V電(dian)池電(dian)壓)和CV (4.2V)區域(yu)。

　　圖1. MAX1737的V-I曲線是Li+電池充電器的標準特性曲線

　　電池低于2.6V時，需要采用不同的充電技術。如果試圖對放電至2.6V以下的電池充電，充電器須提供(gong)一個較低的(de)充電電流(“調理電流”)，將電池(chi)電壓充至2.6V。這是鋰離(li)子電池(chi)過放(fang)電時(shi)所(suo)必須采取的(de)安全機制。VBATT< 2.6V時(shi)強行進行快(kuai)速充電，會使電池(chi)進入不(bu)可恢復的(de)短路狀態。

　　CC向(xiang)CV階(jie)段的(de)過(guo)(guo)渡點(dian)的(de)臨界容(rong)差為± 40mV。之所(suo)以要求(qiu)如此嚴格的(de)容(rong)差，是因為如果CV過(guo)(guo)低，電(dian)(dian)池將無法完全充(chong)(chong)(chong)(chong)滿;而(er)CV過(guo)(guo)高，則會縮短(duan)電(dian)(dian)池的(de)使用壽(shou)命。充(chong)(chong)(chong)(chong)電(dian)(dian)過(guo)(guo)程終止意味著檢測到(dao)電(dian)(dian)池達到(dao)滿電(dian)(dian)量，充(chong)(chong)(chong)(chong)電(dian)(dian)器必須斷(duan)開或關閉。在CV階(jie)段，當檢測到(dao)充(chong)(chong)(chong)(chong)電(dian)(dian)電(dian)(dian)流(liu)降至快充(chong)(chong)(chong)(chong)電(dian)(dian)流(liu)或最大充(chong)(chong)(chong)(chong)電(dian)(dian)電(dian)(dian)流(liu)的(de)一定(ding)比例(通常< 10%)時終止充(chong)(chong)(chong)(chong)電(dian)(dian)。

　　Li+電(dian)池充(chong)電(dian)器參數測試

　　Li+電池(chi)充(chong)電器(qi)設計通(tong)常(chang)包(bao)括兩(liang)個基本部(bu)(bu)分(fen)：數字部(bu)(bu)分(fen)(控制(zhi)狀態機)和(he)模擬部(bu)(bu)分(fen)，模擬部(bu)(bu)分(fen)包(bao)括帶有高精度(>1%)基準、可精確控制(zhi)的(de)電流/電壓(ya)源。對(dui)鋰(li)離子充(chong)電器(qi)(不僅(jin)(jin)指(zhi)IC)進(jin)(jin)行完全(quan)測試是一項非常(chang)棘手且耗(hao)費時間的(de)工作，不僅(jin)(jin)僅(jin)(jin)限于對(dui)電流或電壓(ya)值進(jin)(jin)行檢驗(yan)。

　　測試時(shi)(shi)，應該在整個工(gong)作范圍對充(chong)(chong)電(dian)(dian)(dian)器進行(xing)分段檢測：包括CC階段、從CC到(dao)CV的切換、充(chong)(chong)電(dian)(dian)(dian)終止等(deng)。如(ru)上所(suo)述，測試的理想(xiang)情況是采用常(chang)規(gui)充(chong)(chong)電(dian)(dian)(dian)器的負載：即Li+電(dian)(dian)(dian)池(chi)。然而，由于充(chong)(chong)電(dian)(dian)(dian)過程需要一小(xiao)時(shi)(shi)甚(shen)至(zhi)更長時(shi)(shi)間，使(shi)用鋰電(dian)(dian)(dian)池(chi)進行(xing)測試非常(chang)耗時(shi)(shi)。根據具體測試條件的不同：例(li)如(ru)大容(rong)量電(dian)(dian)(dian)池(chi)+慢(man)速(su)充(chong)(chong)電(dian)(dian)(dian)，小(xiao)容(rong)量電(dian)(dian)(dian)池(chi)+快速(su)充(chong)(chong)電(dian)(dian)(dian)以及其它(ta)可(ke)能(neng)組(zu)合(he)，測試時(shi)(shi)間也不盡相同。

　　此外(wai)，充(chong)電(dian)(dian)(dian)(dian)過(guo)(guo)程無法(fa)在(zai)保證不損(sun)壞電(dian)(dian)(dian)(dian)池的前提下(xia)提高(gao)充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)，因(yin)為充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)受電(dian)(dian)(dian)(dian)池最大充(chong)電(dian)(dian)(dian)(dian)速率(即(ji)快(kuai)速充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu))的制約。對于(yu)消費(fei)類(lei)產品常用的電(dian)(dian)(dian)(dian)池，很(hen)少(shao)規定電(dian)(dian)(dian)(dian)流(liu)大于(yu)1C (在(zai)1小(xiao)時(shi)(shi)(shi)內將電(dian)(dian)(dian)(dian)池完(wan)(wan)全放(fang)電(dian)(dian)(dian)(dian)的電(dian)(dian)(dian)(dian)流(liu))。因(yin)此，大多數情況下(xia)完(wan)(wan)成(cheng)整個(ge)充(chong)電(dian)(dian)(dian)(dian)周期所需(xu)要(yao)的時(shi)(shi)(shi)間(jian)往(wang)往(wang)超過(guo)(guo)兩小(xiao)時(shi)(shi)(shi)。如果需(xu)要(yao)重復(fu)測(ce)試，則需(xu)要(yao)將電(dian)(dian)(dian)(dian)池完(wan)(wan)全放(fang)電(dian)(dian)(dian)(dian) ― 這(zhe)一過(guo)(guo)程僅僅比充(chong)電(dian)(dian)(dian)(dian)稍微短一些。或者，必(bi)須能夠隨(sui)時(shi)(shi)(shi)備(bei)有完(wan)(wan)全放(fang)電(dian)(dian)(dian)(dian)的電(dian)(dian)(dian)(dian)池。

　　另外可以使(shi)用一個(ge)模擬的(de)理想負載替代(dai)真(zhen)實電(dian)(dian)(dian)(dian)池(chi)進(jin)(jin)(jin)行負載測試(shi)。仿真(zhen)時，應驗證電(dian)(dian)(dian)(dian)路(lu)的(de)直流(liu)響應和動態穩(wen)定性。然而，使(shi)用功率測試(shi)所用的(de)標(biao)準負載進(jin)(jin)(jin)行電(dian)(dian)(dian)(dian)池(chi)仿真(zhen)非常困難。與(yu)大多數電(dian)(dian)(dian)(dian)源測試(shi)使(shi)用的(de)負載不(bu)同，電(dian)(dian)(dian)(dian)池(chi)不(bu)能簡單地當作電(dian)(dian)(dian)(dian)阻或(huo)固(gu)定地吸入電(dian)(dian)(dian)(dian)流(liu)。如上所述，必須(xu)在整個(ge)工作范圍內(nei)進(jin)(jin)(jin)行分(fen)段測試(shi)。以下介紹的(de)Li+充電(dian)(dian)(dian)(dian)器測試(shi)電(dian)(dian)(dian)(dian)路(lu)完全滿足這(zhe)些要求。

　　選擇電池模型負載(zai)

　　我們先討論兩個必須考慮但最終放棄的建模方法。電池負載建模的方法之一是：使用一個具有源出(放電)和吸入(充電)電流能力的電壓源與代表電池內阻的電阻串聯。由于Li+電池要求精確控制終止電壓和充電電流，目前所有Li+充電器實際(ji)上(shang)是穩壓電(dian)源轉(zhuan)換(huan)器。

　　此外，由于穩壓電源變換器(充電器)的穩定性取決于負載(電池)的動態特性，因此必須選擇一個與模型非常相似的負載。否則，測試只能驗證充電器本身的V-I特性。

　　如果只是進(jin)行一次性(xing)測試，可以(yi)使(shi)用并聯型(xing)(xing)穩壓器與電(dian)(dian)(dian)(dian)阻串(chuan)聯，這(zhe)足以(yi)模擬電(dian)(dian)(dian)(dian)池的(de)(de)(de)(de)(de)內(nei)(nei)阻，并且，這(zhe)一簡(jian)單的(de)(de)(de)(de)(de)電(dian)(dian)(dian)(dian)池模型(xing)(xing)完全可以(yi)滿(man)足測試要求。這(zhe)種方(fang)法的(de)(de)(de)(de)(de)優勢是由充電(dian)(dian)(dian)(dian)器本身(shen)供電(dian)(dian)(dian)(dian)。然而，更(geng)嚴(yan)格(ge)的(de)(de)(de)(de)(de)測試需要更(geng)精確的(de)(de)(de)(de)(de)模型(xing)(xing)。該模型(xing)(xing)采用內(nei)(nei)部(bu)電(dian)(dian)(dian)(dian)壓源，電(dian)(dian)(dian)(dian)壓值是充電(dian)(dian)(dian)(dian)過程(cheng)中供給電(dian)(dian)(dian)(dian)池的(de)(de)(de)(de)(de)總電(dian)(dian)(dian)(dian)荷的(de)(de)(de)(de)(de)函數(shu)。

　　用恒流(liu)源對電(dian)(dian)(dian)(dian)池(chi)充電(dian)(dian)(dian)(dian)時電(dian)(dian)(dian)(dian)壓將不斷變化，以(yi)一定的(de)(de)(de)正(zheng)斜率(lv)上升。這是(shi)由于(yu)放電(dian)(dian)(dian)(dian)和(he)其它電(dian)(dian)(dian)(dian)池(chi)內部化學(xue)變化過程(cheng)中，電(dian)(dian)(dian)(dian)池(chi)正(zheng)極(ji)(ji)周(zhou)圍累積的(de)(de)(de)極(ji)(ji)化離子逐漸減少。因此，充電(dian)(dian)(dian)(dian)器的(de)(de)(de)工(gong)作(zuo)點取(qu)決于(yu)電(dian)(dian)(dian)(dian)池(chi)連接(jie)時間的(de)(de)(de)長短(duan)，以(yi)及電(dian)(dian)(dian)(dian)池(chi)的(de)(de)(de)工(gong)作(zuo)歷史。用大多數(shu)電(dian)(dian)(dian)(dian)子實驗室能夠找到(dao)的(de)(de)(de)通用器件構建負載，以(yi)模擬(ni)這一復(fu)雜(za)負載的(de)(de)(de)模型(xing)很困難。

　　需(xu)要經常對充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)路(lu)進(jin)行(xing)測試(shi)，或必須詳細(xi)描述電(dian)(dian)(dian)(dian)(dian)路(lu)特(te)性時，準確(que)模擬充(chong)電(dian)(dian)(dian)(dian)(dian)過(guo)程(cheng)(cheng)的電(dian)(dian)(dian)(dian)(dian)池非(fei)常有(you)用(yong)。模擬過(guo)程(cheng)(cheng)需(xu)要連續掃(sao)描充(chong)電(dian)(dian)(dian)(dian)(dian)器的所有(you)直流(liu)工(gong)作點。模擬電(dian)(dian)(dian)(dian)(dian)路(lu)還要顯示結(jie)果(guo)(guo)，使(shi)操作人員可(ke)(ke)以(yi)(yi)查找問(wen)題、故障和干擾。如果(guo)(guo)模擬電(dian)(dian)(dian)(dian)(dian)路(lu)能夠提(ti)供電(dian)(dian)(dian)(dian)(dian)池電(dian)(dian)(dian)(dian)(dian)壓輸出和信號(hao)，這些結(jie)果(guo)(guo)可(ke)(ke)以(yi)(yi)直接作為示波器信號(hao)。測試(shi)速度可(ke)(ke)以(yi)(yi)加(jia)(jia)快(從(cong)幾(ji)小時到數十秒)，并可(ke)(ke)根據需(xu)要進(jin)行(xing)多次反復，比用(yong)真(zhen)正的電(dian)(dian)(dian)(dian)(dian)池測試(shi)更(geng)方便(bian)(bian)。然而，測試(shi)速度加(jia)(jia)快后對確(que)定充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)源(yuan)的熱效應(ying)不利。因此，可(ke)(ke)能需(xu)要額外的長時間測試(shi)，以(yi)(yi)便(bian)(bian)與充(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)源(yuan)和調節電(dian)(dian)(dian)(dian)(dian)路(lu)的熱時間常數相吻合(he)。

　　 建立(li)電池模型負(fu)載

　　圖(tu)2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)模擬的(de)(de)是(shi)單(dan)節鋰離(li)(li)子(zi)(zi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)。充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)CC階段的(de)(de)終(zhong)止充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)和(he)快速(su)充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)由充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)設置決定(ding)。仿真(zhen)器(qi)(qi)(qi)初始(shi)化(hua)時(shi)，可(ke)(ke)設置完全(quan)放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)條件下內部電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)為3V，但(dan)該(gai)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)可(ke)(ke)以提升到4.3V，以測(ce)試(shi)(shi)過充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)情況。3V初始(shi)值通常用于低電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)關(guan)斷電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(用來終(zhong)止鋰離(li)(li)子(zi)(zi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)過程)。這種設計(ji)專門針(zhen)對終(zhong)止充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)為4.2V的(de)(de)標準CC-CV鋰離(li)(li)子(zi)(zi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)。該(gai)設計(ji)調整(zheng)起(qi)來很(hen)容(rong)易，能夠適(shi)應非標準終(zhong)止電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)和(he)完全(quan)放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)的(de)(de)測(ce)試(shi)(shi)。測(ce)試(shi)(shi)時(shi)充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器(qi)(qi)(qi)用高達3A的(de)(de)充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)驅動仿真(zhen)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)，受功率晶體管功耗的(de)(de)限制(zhi)。圖(tu)2電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)模擬了電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)增加的(de)(de)情況，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)是(shi)從仿真(zhen)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)設置為完全(quan)放電(dian)(dian)(dian)(dian)(dian)(dian)(dian)狀(zhuang)態開始(shi)，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)路(lu)充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)的(de)(de)函數(shu)。

　　根據圖(tu)中給出的(de)參數(shu)值，充電(dian)(dian)(dian)電(dian)(dian)(dian)流(liu)為1A時，積分時間常(chang)數(shu)使模擬電(dian)(dian)(dian)路(lu)在6至(zhi)7秒內達到充電(dian)(dian)(dian)器的(de)4.2V限制。對電(dian)(dian)(dian)流(liu)范圍(wei)、內阻、充電(dian)(dian)(dian)終止電(dian)(dian)(dian)壓和(he)完(wan)全放電(dian)(dian)(dian)電(dian)(dian)(dian)壓的(de)模擬是在鋰離子電(dian)(dian)(dian)池(chi)(chi)(本例(li)中指Sony US18650G3)典型(xing)參數(shu)的(de)基(ji)礎上(shang)完(wan)成的(de)。所(suo)仿真(zhen)的(de)電(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)壓沒(mei)有考慮環(huan)境溫度的(de)影響。

　　圖2 單節Li+電(dian)(dian)池充(chong)電(dian)(dian)情(qing)況的仿真電(dian)(dian)路(lu)，該電(dian)(dian)路(lu)可以在不使(shi)用實際電(dian)(dian)池的情(qing)況下測試Li+電(dian)(dian)池充(chong)電(dian)(dian)器

　　并(bing)聯穩壓器(qi)(qi)(qi)設計采(cai)用MAX8515并(bing)聯穩壓器(qi)(qi)(qi)和一對雙極(ji)型功(gong)率晶體管(選擇(ze)該穩壓器(qi)(qi)(qi)時考慮了其內部基(ji)準(zhun)電(dian)(dian)壓的精(jing)度)，大電(dian)(dian)流(liu)TIP35晶體管安裝(zhuang)在能夠耗散(san)25W熱(re)量的散(san)熱(re)器(qi)(qi)(qi)上。

　　MAX4163雙運放(fang)的其中一個(ge)放(fang)大器(qi)(qi)用來(lai)對充電(dian)(dian)電(dian)(dian)流(liu)積分，另一個(ge)放(fang)大器(qi)(qi)對電(dian)(dian)流(liu)測量信號進行(xing)放(fang)大和偏置。該(gai)運算放(fang)大器(qi)(qi)具有較高的電(dian)(dian)源(yuan)抑(yi)制比，并可支(zhi)持滿擺(bai)幅輸入/輸出范圍，簡(jian)化了兩種(zhong)功能(neng)電(dian)(dian)路的設計。注意，與電(dian)(dian)池仿真器(qi)(qi)正端串聯(lian)的0.100Ω電(dian)(dian)流(liu)檢(jian)測電(dian)(dian)阻同時也作為(wei)電(dian)(dian)池內阻。

　　在具有自動測試(shi)-數據采集功能(neng)的系統內工作(zuo)時(shi)，可用(yong)外部信號將仿(fang)真電池復位到完全(quan)放電狀態。另外，手(shou)動操(cao)作(zuo)測試(shi)設置時(shi)，可用(yong)按鍵復位。

　　利用(yong)單(dan)(dan)刀單(dan)(dan)擲(zhi)開關可(ke)以(yi)選擇(ze)仿(fang)真電(dian)(dian)(dian)(dian)(dian)池的(de)(de)兩種工作(zuo)(zuo)模式。擲(zhi)向A端時，實(shi)(shi)現(xian)積分充電(dian)(dian)(dian)(dian)(dian)仿(fang)真器(qi)，如上所述(shu)。擲(zhi)向B端時，仿(fang)真器(qi)將(jiang)設(she)定在某一(yi)固定的(de)(de)直流(liu)(liu)工作(zuo)(zuo)點(dian)對充電(dian)(dian)(dian)(dian)(dian)器(qi)進行(xing)現(xian)場測試時的(de)(de)輸出(chu)電(dian)(dian)(dian)(dian)(dian)壓和(he)吸電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)。為實(shi)(shi)現(xian)這一(yi)功(gong)能(neng)，“設(she)置(zhi)”電(dian)(dian)(dian)(dian)(dian)壓可(ke)通過(guo)改(gai)變50kΩ可(ke)變電(dian)(dian)(dian)(dian)(dian)阻，在2.75V至(zhi)5.75V之間手動調整。這些設(she)置(zhi)電(dian)(dian)(dian)(dian)(dian)壓值與內部吸入電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)有關。仿(fang)真器(qi)端實(shi)(shi)測電(dian)(dian)(dian)(dian)(dian)壓(VBATT)等于設(she)定電(dian)(dian)(dian)(dian)(dian)壓加上吸電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)流(liu)(liu)經仿(fang)真電(dian)(dian)(dian)(dian)(dian)池內阻(0.100Ω電(dian)(dian)(dian)(dian)(dian)阻)產生的(de)(de)壓降。仿(fang)真電(dian)(dian)(dian)(dian)(dian)路工作(zuo)(zuo)時的(de)(de)電(dian)(dian)(dian)(dian)(dian)源取自電(dian)(dian)(dian)(dian)(dian)池充電(dian)(dian)(dian)(dian)(dian)器(qi)輸出(chu)。

　　仿真電路的性能

　　圖(tu)(tu)3為(wei)模(mo)擬鋰離子電(dian)(dian)(dian)(dian)(dian)池充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)至4.2V時(shi)獲得(de)的典型(xing)V-I波(bo)形。從圖(tu)(tu)中(zhong)可以(yi)看出兩個測(ce)試(shi)過(guo)程：一個是(shi)以(yi)1A初始快充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)流充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(曲(qu)線(xian)B和D)，另一個是(shi)以(yi)2A快充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)流充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)(曲(qu)線(xian)A和C)。這兩種情(qing)況下，首先(xian)進(jin)入CC階段(duan)充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)，直到(dao)電(dian)(dian)(dian)(dian)(dian)池電(dian)(dian)(dian)(dian)(dian)壓(ya)達(da)到(dao)終止(zhi)電(dian)(dian)(dian)(dian)(dian)壓(ya)4.2V。在(zai)此之后，電(dian)(dian)(dian)(dian)(dian)流呈指數衰減，而仿真(zhen)電(dian)(dian)(dian)(dian)(dian)池的電(dian)(dian)(dian)(dian)(dian)壓(ya)保持不(bu)變。充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流為(wei)2A時(shi)到(dao)達(da)終止(zhi)電(dian)(dian)(dian)(dian)(dian)壓(ya)所(suo)需的時(shi)間(jian)更(geng)短(duan)，與預期設計相同(tong)。然(ran)而，請注意，電(dian)(dian)(dian)(dian)(dian)流加倍不(bu)會使充(chong)(chong)電(dian)(dian)(dian)(dian)(dian)時(shi)間(jian)減半，只會使到(dao)達(da)CV模(mo)式的時(shi)間(jian)減半，與真(zhen)實電(dian)(dian)(dian)(dian)(dian)池負載的測(ce)試(shi)情(qing)況一樣。

　　圖(tu)4為兩個不同設(she)置(zhi)電(dian)(dian)(dian)壓：3V和4.1V時的(de)(de)吸(xi)電(dian)(dian)(dian)流(liu)V-I曲(qu)線。兩個曲(qu)線的(de)(de)動態電(dian)(dian)(dian)阻(用(yong)斜率(lv)表(biao)示)僅僅是由(you)0.100Ω電(dian)(dian)(dian)阻模擬的(de)(de)電(dian)(dian)(dian)池(chi)內阻。

　　圖3 根據圖2電池仿真電路繪制出的圖形，快速充電波形表明兩種條件下電池充電器的工作情況(kuang)，分別是(shi)：CC階段提供1A (曲線B和(he)(he)D)和(he)(he)2A (曲線A和(he)(he)C)充電(dian)電(dian)流

　　圖4 圖2電(dian)路在電(dian)壓(ya)為4.1V (上部曲(qu)線)和3V (下部曲(qu)線)時的(de)吸入電(dian)流，兩種情況(kuang)下斜率均代表(biao)0.1Ω內阻

　　由于鋰離子電池充電過程需要一小時或更長時間，利用實際負載測試鋰電池充電器將非常耗時，而且往往不切實際。為了加快電池充電器測試，本文介紹了一個簡單電路，用來模擬鋰離子電池。該電路提供了一個不使用實際電池對鋰電池充電器進行測(ce)試的有效手段(duan)。